原帖由 Edison 于 2006-7-11 20:13 发表
Si hole defects are major killer defects with high kill ratios and device yield implications so that it is essential for wafer suppliers to have the capability to inspect for this defect type.
Intel would have a hit squad sent off to deal with production execs if one merely cracked a joke about 70 per cent yields, and I can't see how 40 per cent will ever make the PS3 economically viable.