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15.6 A Power-Efficient 32b ARM ISPro-Acessor Using
Timing-Error Detection and Correction for Transient-
Error Tolerance and Adaptation to PVT Variation
David Bull
1
, Shidhartha Das1
, Karthik Shivshankar
1
, Ganesh Dasika2
,
Krisztian Flautner
1
, David Blaauw2
1
ARM, Cambridge, United Kingdom
2
University of Michigan, Ann Arbor, MIReferences:
[1] S. Das, D. Roberts, S. Lee, S. Pant, et al., “A Self-Tuning DVS Processor
Using Delay-Error Detection and Correction”, IEEE J. Solid-State Circuits, vol.
41, pp.792-804, Apr. 2006.
[2] D. Blaauw, S. Kalaiselvan, K. Lai, et al., “RazorII: In situ Error Detection and
Correction for PVT and SER Tolerance”, ISSCC Dig. Tech. Papers, pp. 292-293,
Feb. 2008.
[3] K. Bowman, J. Tschanz, N. S. Kim, et al., “Energy-Efficient and Metastability-
Immune Timing-Error Detection and Instruction Replay-Based Recovery Circuits
for Dynamic Variation Tolerance”, ISSCC Dig. Tech. Papers, pp.402-403, Feb.
2008.
[4] A. Drake, R. Senger, H. Deogun, et al., “A Distributed Critical-Path Timing
Monitor for a 65nm High-Performance Microprocessor”, ISSCC Dig. Tech.
Papers, Feb. 2007.
[5] J. Tschanz, N. S. Kim, S. Dighe, et al., “Adaptive Frequency and Biasing
Techniques for Tolerance to Dynamic Temperature-Voltage Variations and
Aging”, ISSCC Dig. Tech. Papers, pp. 292-293, Feb. 2007.
[6] UMC, United Microelectronics Corporation, http://www.umc.com/24.8 A 32Gb MLC NAND-Flash Memory with Vth-Endurance-
Enhancing Schemes in 32nm CMOS
Changhyuk Lee, Sok-Kyu Lee, Sunghoon Ahn, Jinhaeng Lee, Wonsun
Park, Yongdeok Cho, Chaekyu Jang, Chulwoo Yang, Sanghwa Chung, In-
Suk Yun, Byoungin Joo, Byoungkwan Jeong, Jeeyul Kim, Jaekwan
Kwon, Hyunjong Jin, Yujong Noh, Jooyun Ha, Moonsoo Sung, Daeil
Choi, Sanghwan Kim, Jeawon Choi, Taeho Jeon, Joong-Seob Yang, Yo-
Hwan Koh
Hynix Semiconductor, Icheon, KoreaAcknowledgements:
The authors would like to thank Layout Team, DV Team, Device Team, Product
Team, and Process Team for great support and development
References:
[1] C. Trinh et al., “A 5.6MB/s 64Gb 4b/Cell NAND Flash Memory in 43nm CMOS”,
in ISSCC Dig. Tech. papers, pp. 246-247, Feb. 2009.
[2] Seung-Ho Chang et al., “A 48nm 32Gb 8-Level NAND Flash Memory with
5.5MB/s Program Throughput”, in ISSCC Dig. Tech. papers, pp. 240-241, Feb.
2009.
[3] Ki-Tae Park et al., “A Zeroing Cell-to-Cell Interference Page Architecture With
Temporary LSB Storing and Parallel MSB Program Scheme for MLC NAND Flash
Memories”, in Symp. VLSI Circuits, pp. 188-189, Jun. 2007.
[4] Raymond Zeng et al., “A 172mm2 32Gb MLC NAND Flash Memory in 34nm
CMOS”, in ISSCC Dig. Tech. papers. pp. 236-237, Feb. 2009. |
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